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Seminar by Prof. Johann-Friedrich Luy


Title: Automotive Data Analysis

Speaker: Prof. Dr.-Ing. Johann-Friedrich Luy (IEEE Fellow)
Daimler AG, Germany

Venue and date: Mech Engg Room 201, at 3 p.m. on 30 Nov 2010 (Tuesday)


Abstract

Huge amounts of data occur during the automotive lifecycle. It is an important
research task to provide sophisticated methods for the data analysis in order
to extract relevant information. For an efficient testing of cars in an early
development phase it is of considerable importance to support rushed testing
procedures with digital data. As an example data mining methods are used to
extract test track profiles and to simulate road conditions. Operations
research methods are applied for the production line control in order to
support a cost minimized production of cars under especial consideration of an
increasing number of derivates. To guarantee a uniform workload across the
plant a so called drift-based production line control approach is introduced.
Quality and reliability is a top concern for premium automobiles. In order to
prevent any field deficiencies, statistical methods are developed to forecast
eventual failures and to support preventive actions. Some examples will be
given.

Speaker profile

Johann-Friedrich Luy, studied electrical engineering at the Technical
University of Munich and received his doctorate in 1988 with Prof. Dr. Wolfgang
Harth on "Production and investigation of W-band avalanche diodes term of
silicon MBE material." From 1989 to 1995 he worked at Daimler-Benz Research in
Ulm high-frequency devices on silicon and silicon-germanium base such as
Schottky diodes, IMPATT diodes and hetero-bipolar transistors. In 1996 he
became head of the Department of Microwave Technology with a focus on the areas
of radar sensors, digital receiver architectures and the development of
integration technology SIMMWIC. Starting in 2000, then were added topics in the
field of antenna technology and wireless systems. In 2004 he took over the
strategic project "in-line inspection", and developed with a project group
telematics test systems, today at the Daimler Group are the world standard in
the production plants. Since 2006 he heads the quality analysis of Daimler AG
with the issues of data-analysis including early warning methods and root cause
analysis and forecasts, information mining including automatic web analytics,
and quality engineering with the development of electronic test systems for
telematics and driver assistance system functions, high-voltage
battery-reporting and analytics. Johann-Friedrich Luy has authored over 50
publications in refereed journals and is an IEEE Fellow. Since 2007 he is
Honorary Professor at the Technical University of Munich.

 

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